For photocurrent measurements with low uncertainties, a wide-dynamic range current-to-voltage converter traceable to resistance standards has been developed at the NIST. The design and calibration of the converter standard are described. For validation, the converter standard was compared to the low-current scale of KRISS.
Proceedings Title: Extended Abstracts of the Conference on Precision Electromagnetic Measurements
Conference Dates: June 14-18, 2010
Conference Location: Daejeon, -1
Pub Type: Conferences
current calibrations, current amplifier, resistance calibrations, photocurrent