Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser

Published

Author(s)

Jack A. Stone Jr., Alois Stejskal, Lowell P. Howard

Abstract

Diode lasers are becoming increasingly important in length metrology. In particular, the tunability of diode lasers makes them attractive for applications such as absolute distance interferometry (ADI). In this paper we describe the current status of our research on the use of diode lasers in ADI and we discuss, more generally, the unique strengths and weaknesses of diode lasers for application to length measurement. For standard interferometry a diode laser is usually a poor replacement for a helium-neon laser, but in selected applications the capabilities of the diode can provide significant advantages.
Citation
Applied Optics
Volume
38(28)
Issue
No. 28

Keywords

absolute distance interferometry, dimensional metrology, diode lasers, length measurement, wavelength sweeping

Citation

Stone, J. , Stejskal, A. and Howard, L. (1999), Absolute Distance Interferometry with a 670-nm External Cavity Diode Laser, Applied Optics (Accessed March 28, 2024)
Created October 1, 1999, Updated February 19, 2017