This letter presents a new transmission line method for measuring the complex permittivity of dielectric materials using propagation constant measurements. In contrast to previous methods, a network analyzer calibration is unnecessary since calibrated scattering parameters are not required. We use measurements in X-band waveguide to show that this technique compares well with the transmission/reflection and cylindrical cavity methods.
Citation: IEEE Microwave and Guided Wave Letters
Pub Type: Journals
dielectric constant, measurement, permittivity, propagation constant