Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can also be caused by interactions involving more than two parameters. In this paper, we generalize an existing strategy, called In-Parameter-Order (IPO), from pairwise testing to t-way testing. A major challenge of our generalization effort is dealing with the combinatorial growth of the number of combinations of parameter-values. We describe a t-way testing tool, called FireEye, and discuss design decisions that are made to enable an efficient implementation of the generalized IPO strategy. We also report several experiments that are designed to evaluate the effectiveness of FireEye.
Conference Dates: March 26-29, 2007
Conference Location: Tucson, AZ
Conference Title: 14th Annual IEEE International Conference and Workshops on the Engineering of Computer Based Systems (ECBS'07)
Pub Type: Conferences
Combinatorial Testing, Software Testing, T-Way Testing