The MAGIK reflectometer complements the Polarized Beam Reflectometer and the Horizontal-Geometry Reflectometer in providing specialized capabilities for measurements of in-plane scattering in addition to world-class depth-profiling (with specular reflectivity) of biological,battery/electrochemical, polymer, and magnetic thin films.
Polarized-beam measurements are possible with the use of a 3He analyzer.
This instrument is an evolution of the AND/R reflectometer, which was located on the NG-1 guide. MAGIK is located along the NG-D guide in the expanded guide hall (part of the NCNR's Expansion Initiative).
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|Reflectometry calculator||Alignment simulator||Offspecular scattering planner|
brian.maranville [at] nist.gov
joseph.dura [at] nist.gov