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Tools and Instruments

Displaying 301 - 325 of 364

Si EUV Photodiode Transfer Standard

Silicon (Si) photodiodes are issued by NIST as transfer standard detectors throughout the extreme ultraviolet spectral region (5 nm to 254 nm). Each device is

SIRCUS facility and uncertainties

The basic SIRCUS calibration setup is shown at the right. The output from a tunable laser is sent through an intensity stabilizer, then through a 'speckle

Sonics VC-375 Ultrasonic Processor

The Sonics VC-375 is an ultrasonic generator which converts 50/60 Hz voltage to high frequency electrical energy. This alternating voltage is applied to disc

Spectral comparator facilities

Visible to near-infrared spectral comparator facility (Vis/NIR SCF) The Vis/NIR SCF is a monochromator-based system that typically measures the spectral power

Spectrally tunable lighting facility

Solid-state lighting (SSL) is increasingly being introduced into the market and it is expected that many of the light sources currently used for general

Standard Firebrand Generator

This apparatus, developed at EL, has been constructed to generate a controlled and repeatable size and mass distribution of glowing firebrands. The purpose of

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At

Telescope calibration facility (TCF)

The Telescope Calibration Facility (TCF) was designed to support the NIST Stars project by providing a facility to radiometricly calibrate long focal length