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A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and
The Divergent Beam Diffractometer is the primary instrument at NIST used to certify powder SRMs for their X-ray diffraction properties. It is a custom-built
The Parallel Beam Diffractometer laboratory is a highly-controlled space (0.01 degree C stability) containing a set of absolutely calibrated stacked goniometer
Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for
The Vector Potential Photoemission Microscope endstation sits at the end of both the SST-I and SST-II beamlines, providing both soft (0.1 keV to 2.2 keV) and
The XAFS station uses a tunable, monochromatic, and moderately high energy X-ray beam (4.5 keV to 23.5 keV) for X-ray absorption spectroscopy measurements. The
X-ray backscatter systems are used for the screening of personnel for hidden weapons and other contraband. Unlike conventional radiographic x-ray systems
The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of