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NanoFab Tool: Asylum Cypher High Resolution Atomic Force Microscope

Photograph of the Asylum Cypher high resolution Atomic Force Microscope.
Photograph of the Asylum Cypher high resolution Atomic Force Microscope.

The Asylum Cypher high resolution atomic force microscope (AFM) offers high resolution measurements and flexibility, allowing researchers to adapt the AFM hardware and programming to meet their needs. The Cypher provides sample characterization in liquid as well as surface characterization using a nanometer scale probe tip to measure atomic scale surface topology. It can also measure the conductivity, magnetic properties, and bulk thermal and mechanical properties on substrates up to 15 mm in diameter.


  • Phase imaging, contact mode, and tapping mode.
  • Electrostatic force microscopy.
  • Magnetic force microscopy.
  • Sample characterization in droplet.
  • X-Y scan range: 35 µm x 35 µm.
  • Z range: 6 µm.
  • User customizable software and hardware inputs.
  • Viscoelastic mapping of mechanical properties.
  • Nanoscale mechanical properties for diverse materials.
  • Force spectroscopy.
  • Surface roughness measurements.
  • Electrical measurements.
  • Piezoresponse force mapping.

Usage Information

Supported Sample Sizes

  • Maximum wafer diameter: 15 mm.
  • Small pieces supported: Yes.

Typical Applications

  • Photoconductivity measurements of organic photovoltaics.
  • Electrochemical strain mapping of li-ion conductive materials.
  • Force spectroscopy of DNA, proteins, and other biological molecules.
  • Drug research, biomedicine, and food research.
  • Nanolithography and nanomanipulation.
Created May 19, 2014, Updated November 21, 2019