NanoFab Tool: Asylum Cypher High Resolution Atomic Force Microscope
The Asylum Cypher high resolution atomic force microscope (AFM) offers high resolution measurements and flexibility, allowing researchers to adapt the AFM hardware and programming to meet their needs. The Cypher provides sample characterization in liquid as well as surface characterization using a nanometer scale probe tip to measure atomic scale surface topology. It can also measure the conductivity, magnetic properties, and bulk thermal and mechanical properties on substrates up to 15 mm in diameter.
Phase imaging, contact mode, and tapping mode.
Electrostatic force microscopy.
Magnetic force microscopy.
Sample characterization in droplet.
X-Y scan range: 35 µm x 35 µm.
Z range: 6 µm.
User customizable software and hardware inputs.
Viscoelastic mapping of mechanical properties.
Nanoscale mechanical properties for diverse materials.
Surface roughness measurements.
Piezoresponse force mapping.
Supported Sample Sizes
Maximum wafer diameter: 15 mm.
Small pieces supported: Yes.
Photoconductivity measurements of organic photovoltaics.
Electrochemical strain mapping of li-ion conductive materials.
Force spectroscopy of DNA, proteins, and other biological molecules.