Field ion source delivers helium ions to sample. Images with secondary electrons or scattered ions.
Silicon drift detector for energy resolution on backscattered ions
Different contrast mechanisms than an electron microscope allowing complementary surface analysis and improved depth of field
Resolution of 0.35 nm
Electron flood gun allows for charge compensation and, in turn, imaging of dielectrics including biological samples
Manufacturer/Model: Zeiss Orion
Scanning Transmission Ion Microscopy (STIM) with helium ions: This work by Taylor Woehl, Ryan White, and Bob Keller represents the first demonstration of using He ions, rather than electrons, in transmission mode to image a sample with a dedicated detector (manuscript accepted to the journal Microscopy & Microanalysis).