FEI Company, Model Quanta 200 F Field Emission Scanning Electron Microscope
Specifications/Capabilities
Field emission gun, high vacuum, low vacuum and environmental vacuum mode capable. Energy dispersive silicon drift x-ray detector, cathodoluminescence system, backscattered electron detector, peltier cooled stage, scanning transmission detector, wet scanning transmission detector, large field detector, gaseous analytical detector, gaseous backscatter detector, low vacuum and low voltage cones, and gaseous secondary electron detector.
Usage Information
Operating Schedule
By Appointment
Access Information
Contact Scott Wight
Details
Campus:
Gaithersburg
Contact
-
Name:Scott Wight
Phone:301-975-3949
Email: scott.wight@nist.gov
Address:
100 Bureau Drive
Gaithersburg MD 20899-8371
Related Publications
Created December 16, 2008, Updated April 26, 2017