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Nanotechnology

Nanometrology

Projects/Programs

Keyword

Organizational Unit

Metrology for Nanomaterials in Medicine

Ongoing

Advances in methods, instrumentation and standards promote the development of measurement science capabilities in separation technology and physical-chemical

Microplastic and Nanoplastic Metrology

Ongoing

The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with

Microscopy Methods

Completed

This project is developing means of quantitatively measuring chemical distributions in three dimensions at the nanometer scale in materials with complex

Modeling and Simulation of Nanofabrication (Archived)

Completed

Most manufacturing has historically been based on top-down fabrication and assembly. With rapid advances in nanotechnology, there is increasing interest in

PTIR combines the spatial resolution of AFM with the specificity of absorption spectroscopy

Nano-Chemical Imaging and -Spectroscopy (IR, nIR, VIS)

Ongoing

Conventional techniques for analyzing chemical composition, such as infrared (IR) microscopy often miss critically important nanoscale details. To overcome this

Nanoelectromagnetics

Ongoing

The core activities in this program are the development and application of metrology for quantitative characterization of hetero-structured materials and

Nanometrology: Composition and Structure of Nanomaterials

Ongoing

Advances in methods, instrumentation and analysis protocols are developed to enhance measurement science capabilities in nanomaterial elemental and

Nanoparticle Metrology in Complex Cellular Environments

Completed

This project, now concluded, developed novel imaging and image analysis tools to examine individual cells and cell populations within the complex chemical

Nanoplasmonics and Three-Dimensional Plasmonic Metamaterials

Ongoing

Metamaterials are tailor-made photonic composites--combinations of materials designed to achieve optical properties not seen in nature. The properties stem from

SEM of nano-contacts used to interrogate grains and grain boundaries

Nanoscale Functional and Structural Characterization of Thin-Film Inorganic Solar Cells

Completed

Large-scale implementation of solar power generation requires photovoltaic (PV) devices with efficiency-to-cost ratios better than existing silicon-based solar

Nanoscale Property Measurements by Atomic Force Microscopy

Ongoing

Develop instrumentation, measurement methodologies, and analytical and numerical analysis for mechanical and electrical atomic force microscopy-based

Nanotribology for Nanomanufacturing (Archived)

Completed

Tribology is the science and technology of interacting surfaces in relative motion and includes studies of friction, adhesion, lubrication, and wear

Neuromorphic Device Measurements

Ongoing

Neuromorphic computing is a radical new approach to information processing for artificial intelligence where, instead of using digital electronics, inspiration

Novel Sources for Focused-ion Beams

Completed

Focused beams of ions have a wide range of uses, from nanoscale imaging to the fabrication of nanomaterials. We are developing novel cold-atom based ion sources

Optical Methods for 3-D Nanostructure Metrology (Archived)

Ongoing

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions more than an

Optical and Microwave Spectroscopy of Microelectronic Systems

Ongoing

The Optical and Microwave Spectroscopy of Microelectronic Systems program in the Spin Electronics group applies best-in-the-world and novel microwave and

Optoelectrical Characterization of Nanostructured Photovoltaic Materials and Devices

Completed

Photovoltaics technology is usually categorized into three generations: 1) devices based on polysilicon; 2) devices based on thin-film direct bandgap

Photonic Dosimetry

Ongoing

As part of the NIST on a Chip program, the Photonic Dosimetry project is developing in-situ sub-micrometer ionizing-radiation dosimetry and calorimetry leading

Probing Graphene Electronic Devices with Atomic Scale Measurements

Ongoing

The interest in using graphene as an electronic material arises in large part from the high speed with which electrons move through the material — approximately

Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry

Ongoing

Atom probe microscopy was developed over 50 years ago; however, only within the last 15 years has the technique begun to see widespread use, due to the

Quantum Conductance

Ongoing

Graphene, the two-dimensional honeycomb carbon lattice isolated in 2004, has enabled significant advancement in a variety of subfields in physics due to its

10 V programmable Josephson voltage standard (PJVS) and (right) PJVS cryopackaged chip, which are disseminated by the NIST standard reference instrument (SRI) program.

Quantum Voltage Project

Ongoing

Goal: To develop Josephson voltage standard (JVS) systems to improve the dissemination of primary standards and the accuracy of voltage measurements from DC to

Real-Time Tracking and Fluorescence Spectroscopy of Individual Nanoparticles (Archived)

Completed

The behavior and properties of macroscale objects are stable and predictable because they are the result of the average behavior of very large numbers of atoms

Reliability Metrologies for Advanced Electronic Interconnects

Completed

This project, now concluded, developed methods to evaluate the reliability of thin films and interconnects in their as-manufactured states. Such tests are

The SPMforAMP project develops novel SPM methods

Scanning Probe Microscopy for Advanced Materials and Processes

Ongoing

Local material-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to leverage for their

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---Office of Reference Materials
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---Biosystems and Biomaterials Division
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----Cellular Engineering Group
----Biomaterials Group
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----Complex Microbial Systems Group
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----Biosystems and Biomaterials Division - HQ
---Chemical Sciences Division
----Biochemical and Exposure Science Group
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----Gas Sensing Metrology Group
----Inorganic Chemical Metrology Group
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---Biomolecular Measurement Division
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----Biomolecular Measurement Division - HQ
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---Materials Science and Engineering Division
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----Polymers Processing Group
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----Materials Science and Engineering Division - HQ
----Functional Polymers Group
----Functional Nanostructured Materials Group
---Materials Measurement Science Division
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----Nanomechanical Properties Group
----Nano Materials Research Group
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----Materials Measurement Science Division - HQ
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---Microsystems and Nanotechnology Division
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----Photonics and Optomechanics Group
---Time and Frequency Division
----Atomic Devices & Instrumentation Group
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----Quantum & Nonlinear Nanophotonics Group
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----Time and Frequency - HQ
---Quantum Physics Division
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----Dosimetry Group
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---Sensor Science Division
----Fundamental Thermodynamics Group
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----Temperature & Humidity Group
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----Fluid Metrology Group
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---Applied Physics Division
----Advanced Microwave Photonics Group
----Spin Electronics Group
----Applied Physics - HQ
----Faint Photonics Group
----Quantitative Nanostructure Characterization Group
----Quantum Devices Group
----Molecular and Bio-Photonics Group
----Optoelectronic Manufacturing Group
----Magnetic Imaging Group
----Quantum Nanophotonics Group
----Sources and Detectors Group
---Quantum Measurement Division
----Quantum Optics Group
----Mass and Force Group
----Quantum Measurement - HQ
----Laser Cooling and Trapping Group
----Fundamental Electrical Measurements Group
----Applied Electrical Metrology Group
----Atomic Spectroscopy Group
---Quantum Sensors Division
----Device Fabrication Group
----Long Wavelength Sensors and Applications Group
----Quantum Calorimeters Group
----Quantum Electronics Group
----Quantum Processing Group
----Quantum Sensors Group
----Quantum Sensors – HQ
----Nanoscale Spin Dynamics Group
----Microfabrication Group
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----Magnetics Group
---Nanoscale Device Characterization Division
----Atom Scale Device Group
----Nanoscale Device Characterization Division - HQ
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----Nanoscale Spectroscopy Group
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---Physical Measurement Laboratory Office
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--Office of Advanced Manufacturing
---Microelectronics Manufacturing Division
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