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Projects/Programs

Displaying 51 - 75 of 241

Diffraction Metrology and Standards

Ongoing
Our objective is the development of Standard Reference Materials ( SRMs ) and quantitative, reproducible, and accurate measurement methods for characterization

Earth Energy Budget

Ongoing
The goal of this project is to extend and improve the measurements of the key climate record of the long-term balance between Earth absorption of solar energy

Electrical Scanning Probe Microscopy

Ongoing
Develop and apply advanced measurement methods, electric field reference materials, and COMSOL models to make electrical scanning probe microscopes (eSPMs)

Electronic Biophysical Measurements

Ongoing
Chipscale electronic devices such as field-effect transistors (FETs) are being developed for biochemical applications ranging from clinical diagnostics to

Electronic Material Characterization

Ongoing
To provide the necessary information for electronic material manufacturers to predict how and when failures will occur and enable lifetime analysis appropriate

Electron-Solid Interactions

Ongoing
Fundamental understanding of electron-solid interactions is key to interpreting electron microscopy images for quantitative metrology. Scanning electron

e-Statistics

Ongoing
Develop NIST standard reference tools to implement core statistics and metrology computations.

EUV Scatterometry

Ongoing
The state of the art for measurement and inspection of the smallest printed features on an integrated circuits (IC) chip is a combination of electron scanning