TY  - CONF
AU  - Richard Van
C2  - Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Arlington, TX
DA  - 1995-01-01
LA  - en
PB  - Proc., IEEE Intl. Symp. on Electrical Insulation and Dielectric Phenomena (CEIDP), Arlington, TX
PY  - 1995
TI  - Physics and Chemistry of Partial Discharge and Corona - Recent Advances and Future Challenges
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=26792
ER  -