TY  - GEN
AU  - Kevin Lee
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 1998-03-01
LA  - en
M1  - 103
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 1998
TI  - Degradation of GaAs/AlGaAs Quantized Hall Resistors With Alloyed AuGe/Ni Contacts
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=2145
ER  -