TY - CONF AU - Obrzut, Jan C2 - AIP Conference Proceedings, Characterization and Metrology for ULSI Technology, vol 449, pp607-609 (1998), Gaithersburg, MD DA - 1998-03-03 LA - en PB - AIP Conference Proceedings, Characterization and Metrology for ULSI Technology, vol 449, pp607-609 (1998), Gaithersburg, MD PY - 1998 TI - Interconnection Continuity Test for Packaged Functional Modules UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854051 ER -