TY  - CONF
AU  - Jan Obrzut
C2  - AIP Conference Proceedings, Characterization and Metrology for ULSI Technology, vol 449, pp607-609 (1998), Gaithersburg, MD
DA  - 1998-03-03
LA  - en
PB  - AIP Conference Proceedings, Characterization and Metrology for ULSI Technology, vol 449, pp607-609 (1998), Gaithersburg, MD
PY  - 1998
TI  - Interconnection Continuity Test for Packaged Functional Modules
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854051
ER  -