TY  - JOUR
AU  - Nicholas Ritchie
AU  - Dale E. Newbury
AU  - Jeffrey Davis
C2  - Microscopy and Microanalysis
DA  - 2012-07-30 04:07:00
DO  - https://doi.org/10.1017/S1431927612001109
LA  - en
M1  - 18
PB  - Microscopy and Microanalysis
PY  - 2012
TI  - EDS measurements of x-ray intensity at WDS precision and accuracy using a silicon drift detector
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=908839
ER  -