TY  - JOUR
AU  - William Alexander Osborn
AU  - Mark McLean
AU  - Brian Bush
C2  - Microscopy and Microanalysis
DA  - 2019-02-01 05:02:00
DO  - https://doi.org/10.1017/S1431927618016173
LA  - en
PB  - Microscopy and Microanalysis
PY  - 2019
TI  - Selected Area Electron Beam Induced Deposition of Pt and W for Electron Back Scattered Diffraction Backgrounds
ER  -