TY  - GEN
AU  - Mark Vaudin
AU  - Debra Kaiser
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2001-05-01
LA  - en
M1  - 106 No. 3
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2001
TI  - Workshop on Texture in Electronic Applications
ER  -