TY  - JOUR
AU  - Daniel Josell
AU  - Thomas P. Moffat
C2  - Applied Optics
DA  - 2022-04-26 04:04:00
DO  - https://doi.org/10.1364/AO.456427
LA  - en
PB  - Applied Optics
PY  - 2022
TI  - Fabrication of a fractal pattern device for focus characterizations of X-ray imaging systems by DRIE and Bottom-up Au Electroplating
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=934297
ER  -