TY  - JOUR
AU  - Donald Windover
AU  - David Gil
AU  - Yasushi Azuma
AU  - Toshiyuki Fujimoto
C2  - Measurement Science & Technology
DA  - 2014-09-08 04:09:00
DO  - https://doi.org/10.1088/0957-0233/25/10/105007
LA  - en
M1  - 25
PB  - Measurement Science & Technology
PY  - 2014
TI  - Determining sample alignment in X-ray Reflectometry using thickness and density from GaAs/AlAs multilayer certified reference materials
ER  -