TY  - JOUR
AU  - Jason Holm
C2  - Electronic Device Failure Analysis
DA  - 2021-11-01 04:11:00
LA  - en
M1  - 4
PB  - Electronic Device Failure Analysis
PY  - 2021
TI  - A Brief Overview of Scanning Transmission Electron Microscopy in a Scanning Electron Microscope (STEM-in-SEM)
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932860
ER  -