TY - CONF AU - Evgheni Strelcov AU - Lin You AU - Yaw S. Obeng AU - Joseph J. Kopanski C2 - Conference Proceedings of the 48th International Symposium for Testing and Failure Analysis (ISTFA 2022), Pasadena, CA, US DA - 2022-10-30 04:10:00 DO - https://doi.org/10.31399/asm.cp.istfa2022p0426 LA - en PB - Conference Proceedings of the 48th International Symposium for Testing and Failure Analysis (ISTFA 2022), Pasadena, CA, US PY - 2022 TI - Die-Level Micrometers-Deep Subsurface Imaging for Fault Isolation Using Remote Bias Induced Electrostatic Force Microscopy UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935283 ER -