TY  - GEN
AU  - David Flater
C2  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2014-10-30
DO  - https://doi.org/10.6028/NIST.TN.1855
LA  - en
PB  - Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2014
TI  - Screening for factors affecting application performance in profiling measurements
ER  -