TY  - CONF
AU  - E Drescher-Krasicka
AU  - T Moore
AU  - T Hartfield
AU  - D Chery
C2  - International Conference on Characterization and Metrology for ULSI Technology, Undefined
DA  - 2008-10-16 14:10:19
LA  - en
PB  - International Conference on Characterization and Metrology for ULSI Technology, Undefined
PY  - 2008
TI  - Scanning Acoustic Microscopy Stress Measurements in Electronic Packaging
ER  -