TY - CONF AU - E Drescher-Krasicka AU - T Moore AU - T Hartfield AU - D Chery C2 - International Conference on Characterization and Metrology for ULSI Technology, Undefined DA - 2008-10-16 14:10:19 LA - en PB - International Conference on Characterization and Metrology for ULSI Technology, Undefined PY - 2008 TI - Scanning Acoustic Microscopy Stress Measurements in Electronic Packaging ER -