TY  - JOUR
AU  - Robert D. McMichael
AU  - C Ross
AU  - V Chuang
C2  - Journal of Applied Physics
DA  - 2008-10-16 14:10:19
LA  - en
PB  - Journal of Applied Physics
PY  - 2008
TI  - Thickness Dependence of Magnetic Film Edge Properties in Ni<sub>80</sub>Fe<sub>20</sub> Stripes
ER  -