TY  - CHAP
AU  - Yong Sik Kim
C2  - Trapping Highly-Charged Ions: Fundamentals and Applications, NOVA Science Publisher, Hauppauge, NY
DA  - 2017-02-19 20:02:57
LA  - en
PB  - Trapping Highly-Charged Ions: Fundamentals and Applications, NOVA Science Publisher, Hauppauge, NY
PY  - 2017
TI  - Relativistic Atomic Structure Theory for Highly-Charged Ions
ER  -