TY  - CONF
AU  - Jason Holm
AU  - Bob Keller
C2  - Microscopy & Microanalysis 2015 Meeting, Portland, OR, US
DA  - 2015-08-06 04:08:00
DO  - https://doi.org/10.1017/S1431927615010119
LA  - en
M1  - 21 (Suppl 3)
PB  - Microscopy & Microanalysis 2015 Meeting, Portland, OR, US
PY  - 2015
TI  - Analytical Transmission Scanning Electron Microscopy: Extending the Capabilities of a Conventional SEM Using an Off-the-Shelf Transmission Detector
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=918051
ER  -