TY  - CONF
AU  - Joseph Kopanski
AU  - Lin You
C2  - Proceedings of the 2019 International Conference on Frontiers of Characterization and Metrology 
for Nanoelectronics, Monterey, CA, US
DA  - 2019-03-31 04:03:00
LA  - en
PB  - Proceedings of the 2019 International Conference on Frontiers of Characterization and Metrology 
for Nanoelectronics, Monterey, CA, US
PY  - 2019
TI  - Electric Field Gradient Reference Material for Scanning Probe Microscopy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927329
ER  -