TY  - CONF
AU  - Dmitry Veksler
AU  - Jason Campbell
AU  - Kin Cheung
AU  - J. Zhong
AU  - H. Zhu
AU  - C. Zhao
C2  - proceedings of 2016 IEEE International Reliability Physics Symposium, Pasadena, CA, US
DA  - 2016-04-16 04:04:00
LA  - en
PB  - proceedings of 2016 IEEE International Reliability Physics Symposium, Pasadena, CA, US
PY  - 2016
TI  - Device-Level Jitter as a Probe of Ultrafast Traps in High-k MOSFETs
ER  -