TY  - CONF
AU  - Perry Wilson
C2  - 2004 IEEE International Symposium on EMC, Santa Clara, CA
DA  - 2004-08-09
LA  - en
PB  - 2004 IEEE International Symposium on EMC, Santa Clara, CA
PY  - 2004
TI  - Emission and Immunity Testing: Test Object Electrical Size and its Implication
ER  -