TY - CONF AU - Allen Hefner Jr. AU - Ty McNutt AU - David Berning AU - Ranbir Singh AU - Adwoa Akuffo C2 - Proceedings of ICSREM 2003, France, 1, FR DA - 2003-10-05 00:10:00 LA - en PB - Proceedings of ICSREM 2003, France, 1, FR PY - 2003 TI - The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes UR - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31552 ER -