TY  - CONF
AU  - Wang, Bin
AU  - Suehle, John
AU  - Vogel, Eric
AU  - Conley, J.
AU  - Weintraub, C
AU  - Johnston, A.
AU  - Bernstein, J
C2  - IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
DA  - 2001-10-18 00:10:00
LA  - en
PB  - IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
PY  - 2001
TI  - Latent Reliability Degradation of Ultra-Thin Oxides after Heavy Ion and Gamma Ray Irradiation
ER  -