TY  - CONF
AU  - Bin Wang
AU  - John Suehle
AU  - Eric Vogel
AU  - J. Conley
AU  - C Weintraub
AU  - A. Johnston
AU  - J Bernstein
C2  - IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
DA  - 2001-10-18 00:10:00
LA  - en
PB  - IEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
PY  - 2001
TI  - Latent Reliability Degradation of Ultra-Thin Oxides after Heavy Ion and Gamma Ray Irradiation
ER  -