TY  - CONF
AU  - Wang, Bin
AU  - Suehle, John
AU  - Vogel, Eric
AU  - Bernstein, J
C2  - 2000 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
DA  - 2000-12-31 00:12:00
LA  - en
PB  - 2000 IIEEE International Integrated Reliability Workshop Final Report, Lake Tahoe, CA, USA
PY  - 2000
TI  - The Effect of Stress Interruption and Pulsed Biased Stress on Ultra-Thin Gate Dielectric Reliability
ER  -