TY  - JOUR
AU  - Y Shimada
AU  - N Matsubayashi
AU  - M Imamura
AU  - M Suzuki
AU  - Yukihiru Higashi
AU  - H Ando
AU  - H Takenaka
AU  - S Kurosawa
AU  - S Tanuma
AU  - Cedric Powell
C2  - Surface and Interface Analysis
DA  - 2000-05-01 00:05:00
LA  - en
M1  - 29
PB  - Surface and Interface Analysis
PY  - 2000
TI  - Experimental Determination of Electron Effective Attenuation Lengths in Silicon Dioxide Thin Films Using Synchrotron Radiation - II. Effects of Elastic Scattering
ER  -