TY  - JOUR
AU  - Miguel Jimeno
AU  - K Christensen
AU  - Allen Roginsky
C2  - IEEE Electronics Letters
DA  - 2008-03-27 00:03:00
LA  - en
M1  - 44
PB  - IEEE Electronics Letters
PY  - 2008
TI  - A Two-Tier Bloom Filter to Achieve Faster Membership Testing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=51317
ER  -