TY  - CONF
AU  - Jun-Feng Song
AU  - Christopher Evans
AU  - Michael McGlauflin
AU  - Eric Whitenton
AU  - Theodore Vorburger
AU  - Y Yuan
C2  - SPIE Electronic Imaging Conference, Scattering and Surface Roughness II, Zu-Han Gu, Alexei A. Maradudin, Editors, San Diego, CA, USA
DA  - 1998-10-01 00:10:00
LA  - en
M1  - 3426
PB  - SPIE Electronic Imaging Conference, Scattering and Surface Roughness II, Zu-Han Gu, Alexei A. Maradudin, Editors, San Diego, CA, USA
PY  - 1998
TI  - NIST Virtual/Physical Random Profile Roughness Calibration Standards
ER  -