TY  - GEN
AU  - N Armstrong
AU  - W Kalceff
AU  - James Cline
AU  - John Bonevich
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2004-02-01 00:02:00
LA  - en
M1  - 109 No. 1
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2004
TI  - Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles
ER  -