TY  - CONF
AU  - N Armstrong
AU  - W Kalceff
AU  - James Cline
AU  - John Bonevich
C2  - Analysis of Microstructure and Residual Stress by Diffraction Methods, International Conference | 3rd| Diffraction Analysis of the Microstructure of Materials | Springer, Trento, 1, IT
DA  - 2004-07-01 00:07:00
LA  - en
M1  - 68
PB  - Analysis of Microstructure and Residual Stress by Diffraction Methods, International Conference | 3rd| Diffraction Analysis of the Microstructure of Materials | Springer, Trento, 1, IT
PY  - 2004
TI  - A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material
ER  -