TY  - JOUR
AU  - Brian Maranville
AU  - J Mallett
AU  - Thomas Moffat
AU  - Robert McMichael
AU  - Andrew Chen
AU  - William Egelhoff Jr.
C2  - Journal of Applied Physics
DA  - 2005-05-01 00:05:00
LA  - en
M1  - 97 No. 10
PB  - Journal of Applied Physics
PY  - 2005
TI  - Effect of Conformal Roughness on Ferromagnetic Resonance Linewidth in Thin Permalloy Films
ER  -