TY  - JOUR
AU  - Jae Kim
AU  - Martin Chiang
AU  - D Kawaguchi
AU  - Naomi Eidelman
AU  - Christopher Stafford
AU  - Chang Moon
C2  - Journal of Physics D-Applied Physics
DA  - 2010-12-22 00:12:00
LA  - en
M1  - 44
PB  - Journal of Physics D-Applied Physics
PY  - 2010
TI  - Combinatorial Library Designs for Quantifying Thin Film Adhesion via the Edge Delamination Test
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852688
ER  -