TY  - JOUR
AU  - Scott Schmucker
AU  - Pradeep Namboodiri
AU  - Ranjit Kashid
AU  - Xiqiao Wang
AU  - Binhui Hu
AU  - Jonathan Wyrick
AU  - Alline Myers
AU  - Joshua Schumacher
AU  - Richard Silver
AU  - Michael Stewart
C2  - Physical Review Applied
DA  - 2019-03-29 00:03:00
DO  - https://doi.org/10.1103/PhysRevApplied.11.034071
LA  - en
M1  - 11
PB  - Physical Review Applied
PY  - 2019
TI  - Low-resistance, high-yield electrical contacts to atom scale Si:P devices using palladium silicide
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=926446
ER  -