TY  - JOUR
AU  - David Nminibapiel
AU  - Dmitry Veksler
AU  - Pragya Shrestha
AU  - Jason Campbell
AU  - Jason Ryan
AU  - Helmut Baumgart
AU  - Kin Cheung
C2  - IEEE Electron Device Letters
DA  - 2017-05-22 00:05:00
LA  - en
PB  - IEEE Electron Device Letters
PY  - 2017
TI  - Impact of RRAM Read Fluctuations on the Program-Verify Approach
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922878
ER  -