TY - GEN AU - Brian Lang AU - Aaron Urbas AU - Paul DeRose AU - Hung-Kung Liu AU - John Travis AU - Steven Choquette AU - Kenneth Cole C2 - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD DA - 2017-07-10 00:07:00 DO - https://doi.org/10.6028/jres.122.033 LA - en M1 - 122 PB - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD PY - 2017 TI - Development of NIST Standard Reference Material 2082, a Pathlength Standard for Measurements in the Ultraviolet Spectrum ER -