TY  - CONF
AU  - Lin You
AU  - Chukwudi Okoro
AU  - Jungjoon Ahn
AU  - Joseph Kopanski
AU  - Yaw Obeng
C2  - ECS Trasnsaction: Moore-Than-More 2, Orlando, FL, US
DA  - 2014-05-12 00:05:00
LA  - en
PB  - ECS Trasnsaction: Moore-Than-More 2, Orlando, FL, US
PY  - 2014
TI  - Microwave-Based Metrology Platform Development: Application of Broad-Band RF Metrology to Integrated Circuit Reliability Analyses
ER  -