TY  - GEN
AU  - Mohamed Hany
AU  - Rick Candell
AU  - Kang Lee
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2019-03-18 00:03:00
DO  - https://doi.org/10.6028/jres.124.007
LA  - en
M1  - 124
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2019
TI  - A Black-Box Non-Invasive Characterization Method for Industrial Wireless Networks
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922920
ER  -