TY  - GEN
AU  - Thomas Hedberg Jr.
AU  - Moneer Helu
AU  - Sylvere Krima
AU  - Allison Barnard Feeney
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-07-16 00:07:00
DO  - https://doi.org/10.6028/NIST.AMS.300-10
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - Recommendations on Ensuring Traceability and Trustworthiness of Manufacturing-Related Data
ER  -