TY  - GEN
AU  - Maxwell Praniewicz
AU  - Brandon Lane
AU  - Felix Kim
AU  - Christopher Saldana
C2  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2020-10-01 00:10:00
DO  - https://doi.org/10.6028/jres.125.031
LA  - en
M1  - 125
PB  - Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2020
TI  - X-ray Computed Tomography Data of Additive Manufacturing Metrology Testbed (AMMT) Parts: “Overhang Part X4”
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=930955
ER  -