TY  - JOUR
AU  - Duane McCrory
AU  - Mark Anders
AU  - Jason Ryan
AU  - Pragya Shrestha
AU  - Kin Cheung
AU  - Patrick Lenahan
AU  - Jason Campbell
C2  - IEEE Transactions on Device and Materials Reliability
DA  - 2018-03-20 00:03:00
LA  - en
M1  - 18
PB  - IEEE Transactions on Device and Materials Reliability
PY  - 2018
TI  - Wafer-Level Electrically Detected Magnetic Resonance:Magnetic Resonance in a Probing Station
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=925603
ER  -