TY  - GEN
AU  - Anantha Narayanan
AU  - Ronay Ak
AU  - Yung-Tsun Lee
AU  - Rumi Ghosh
AU  - Sudarsan Rachuri
C2  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
DA  - 2017-04-13 00:04:00
DO  - https://doi.org/10.6028/NIST.AMS.100-7
LA  - en
PB  - Advanced Manufacturing Series (NIST AMS), National Institute of Standards and Technology, Gaithersburg, MD
PY  - 2017
TI  - Summary of the Symposium on Data Analytics for Advanced Manufacturing
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=922964
ER  -