TY  - CONF
AU  - Jarred Heigel
AU  - Eric Whitenton
C2  - Proceedings of the ASME International Manufacturing Science and Engineering Conference 2010, Erie, PA, US
DA  - 2010-10-12 00:10:00
LA  - en
PB  - Proceedings of the ASME International Manufacturing Science and Engineering Conference 2010, Erie, PA, US
PY  - 2010
TI  - The Effects of Emissitivity and Camera Point-Spread Function on the Temperature Measurement of Segmented Chip Formation Using Infrared Thermograhy
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905892
ER  -